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| Our staff of test engineers can design and tailor a solution to meet your individual needs. Services available include: |
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Our years of experience with boards of all sizes, complexities, and technologies places us in the unique position of being experts in the field.
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• In-circuit Test Development
• Design for Testability
• Programmable Device Modeling
• Digital & Hybrid Device Modeling
• Prototype Test & Repair |
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With this expertise, we will design and install a fully documented and fault graded test at your facility. We provide full engineering access during and after test installation.
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We specialize in the advanced capabilities of the Agilent 307X and GR228X test platforms. We guarantee completeness, accuracy, and stability of all tests.
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When it comes to your product insist on the best. You can afford nothing less.
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| • Probe accessibility audits and software generated test programs from numerous vendor |
| CAD systems using FabMaster software. |
| • Fixture fabrication data to support the vendor of your choice |
| • Complete documentation and test program conforming to your requirements |
| • Rapid test program development |
| • Advanced boundary scan test support |
| • Panelized board testing |
| • Board testing utilizing dual access, bi-level fixturing |
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| • Thorough analysis of your circuit designs |
| • Formalized documentation suggesting enhancements and extent of testability |
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| Programmable Device Test Generation
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| • Internal testability analysis to enhance fault coverage |
| • Automatic test generation and fault grading |
| • High volume and quick turn-around |
| • LCA, Altera Max, MACH, Actel, ISP, Lattice Cypress, Flash devices supported |
| • JEDEC burn files with test vectors for factory production |
| • Flash, ISP and EEPROM programing |
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| Digital & Hybrid Device Modeling
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| • Extensive device libraries minimizes modeling development costs |
| • Complex device testing is our specialty |
| • Fault grading reports for test coverage |
| • Full cell Ram/Rom testing |
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| Prototype Test and Repair
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| • Quick turn-around for testing prototypes |
| • Pin-point diagnostics with repair at customers request |
| • Concurrent engineering |
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